Document Type

Journal Article

Department/Unit

Institute of Computational and Theoretical Studies

Title

X-ray photoelectron diffraction study of Cu(1 1 1): Multiple scattering investigation

Language

English

Abstract

Multiple scattering theory based on a cluster model is used to simulate full-hemispherical X-ray photoelectron diffraction measurements in order to verify how state of the art multiple scattering simulations are able to reproduce the experiment. This approach is applied to the Cu(1 1 1) surface for two different photoelectron kinetic energies. Differences and similarities between single and multiple scattering are discussed in comparison with experimental results. We find that the present approach gives very good results despite some limitations. © 2005 Elsevier B.V. All rights reserved.

Keywords

Copper, Diffraction, Electron solid interaction, Multiple scattering, Photoelectron diffraction, Scattering

Publication Date

2006

Source Publication Title

Surface Science

Volume

600

Issue

2

Start Page

380

End Page

385

Publisher

Elsevier

DOI

10.1016/j.susc.2005.10.038

Link to Publisher's Edition

http://dx.doi.org/10.1016/j.susc.2005.10.038

ISSN (print)

00396028

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