Document Type

Journal Article

Department/Unit

Department of Physics

Title

Advantages of admittance spectroscopy over time-of-flight technique for studying charge transport in an organic semiconductor

Publication Year

2009

Journal Title

Journal of Applied Physics

Volume number

106

Issue number

8

Publisher

American Institute of Physics

First Page (page number)

083710-1

Last Page (page number)

083710-5

DOI

10.1063/1.3251409

ISSN (print)

00218979

Link to Publisher’s Edition

http://dx.doi.org/10.1063/1.3251409

ISSN (electronic)

10897550

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