Department of Mathematics
Automated visual inspection of patterned fabrics, rather than of plain and twill fabrics, has been increasingly focused on by our peers. The aim of this inspection is to detect, identify and locate any defects on a patterned fabric surface to maintain high quality control in manufacturing. This paper presents a novel Elo rating (ER) method to achieve defect detection in the spirit of sportsmanship, i.e., fair matches between partitions on an image. An image can be divided into partitions of standard size. With a start-up reference point, matches between various partitions are updated through an Elo point matrix. A partition with a light defect is regarded as a strong player who will always win, a defect-free partition is an average player with a tied result, and a partition with a dark defect is a weak player who will always lose. After finishing all matches, partitions with light defects accumulate high Elo points and partitions with dark defects accumulate low Elo points. Any partition with defects will be shown in the resultant thresholded image: a white resultant image corresponds to a light defect and a grey resultant image corresponds to a dark defect. The ER method was evaluated on databases of dot-patterned fabrics (110 defect-free and 120 defective images), star-patterned fabrics (30 defect-free and 26 defective images) and box-patterned fabrics (25 defect-free and 25 defective images). By comparing the resultant and ground-truth images, an overall detection success rate of 97.07% was achieved, which is comparable to the state-of-the-art methods.
Elo rating, Sportsmanship, Match, Partition, Fabric inspection, Defect detection, Texture analysis, Patterned texture
Source Publication Title
Copyright © 2015 Elsevier Ltd. All rights reserved.
The second author was supported by a Hong Kong Baptist University Faculty Research Grant: FRG1/12-13/075.
Link to Publisher's Edition
Tsang, Colin S.C., Henry Y. T. Ngan, and Grantham K.H. Pang. "Fabric inspection based on the Elo rating method." Pattern Recognition 51 (2016): 378-394.
Available for download on Sunday, April 01, 2018