Document Type

Journal Article

Title

Advantages of admittance spectroscopy over time-of-flight technique for studying charge transport in an organic semiconductor

Department/Unit

Department of Physics

Language

English

Publication Date

10-1-2009

Source Publication Title

Journal of Applied Physics

Volume

106

Issue

8

Start Page

083710-1

End Page

083710-5

Publisher

American Institute of Physics

DOI

10.1063/1.3251409

Link to Publisher's Edition

http://dx.doi.org/10.1063/1.3251409

ISSN (print)

00218979

ISSN (electronic)

10897550

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